[OE-core] ✗ patchtest: failure for Make SSTATE_SCAN_CMD vars configurable using weak defaults.

[Patchwork]

== Series Details ==

Series: Make SSTATE_SCAN_CMD vars configurable using weak defaults.
Revision: 1
URL   : https://patchwork.openembedded.org/series/4967/
State : failure

== Summary ==


Thank you for submitting this patch series to OpenEmbedded Core. This is
an automated response. Several tests have been executed on the proposed
series by patchtest resulting in the following failures:



* Patch            Make SSTATE_SCAN_CMD vars configurable using weak defaults.
 Issue             Shortlog does not follow expected format [test_shortlog_format] 
  Suggested fix    Commit shortlog (first line of commit message) should follow the format "<target>: <summary>"



If you believe any of these test results are incorrect, please reply to the
mailing list (openembedded-core at lists.openembedded.org) raising your concerns.
Otherwise we would appreciate you correcting the issues and submitting a new
version of the patchset if applicable. Please ensure you add/increment the
version number when sending the new version (i.e. [PATCH] -> [PATCH v2] ->
[PATCH v3] -> ...).

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Test framework: http://git.yoctoproject.org/cgit/cgit.cgi/patchtest
Test suite:     http://git.yoctoproject.org/cgit/cgit.cgi/patchtest-oe