[OE-core] ✗ patchtest: failure for Open file with O_CLOEXEC to avoid fd leak

Patchwork patchwork at patchwork.openembedded.org
Sun Jan 19 04:02:32 UTC 2020


== Series Details ==

Series: Open file with O_CLOEXEC to avoid fd leak
Revision: 1
URL   : https://patchwork.openembedded.org/series/22123/
State : failure

== Summary ==


Thank you for submitting this patch series to OpenEmbedded Core. This is
an automated response. Several tests have been executed on the proposed
series by patchtest resulting in the following failures:



* Issue             Series does not apply on top of target branch [test_series_merge_on_head] 
  Suggested fix    Rebase your series on top of targeted branch
  Targeted branch  master (currently at 9d7a521971)

* Patch            Open file with O_CLOEXEC to avoid fd leak
 Issue             Shortlog does not follow expected format [test_shortlog_format] 
  Suggested fix    Commit shortlog (first line of commit message) should follow the format "<target>: <summary>"

* Patch            Open file with O_CLOEXEC to avoid fd leak
 Issue             Patch is missing Signed-off-by [test_signed_off_by_presence] 
  Suggested fix    Sign off the patch (either manually or with "git commit --amend -s")



If you believe any of these test results are incorrect, please reply to the
mailing list (openembedded-core at lists.openembedded.org) raising your concerns.
Otherwise we would appreciate you correcting the issues and submitting a new
version of the patchset if applicable. Please ensure you add/increment the
version number when sending the new version (i.e. [PATCH] -> [PATCH v2] ->
[PATCH v3] -> ...).

---
Guidelines:     https://www.openembedded.org/wiki/Commit_Patch_Message_Guidelines
Test framework: http://git.yoctoproject.org/cgit/cgit.cgi/patchtest
Test suite:     http://git.yoctoproject.org/cgit/cgit.cgi/patchtest-oe



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